The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2024

Filed:

Jul. 26, 2022
Applicant:

Apple Inc., Cupertino, CA (US);

Inventor:

Arnold H Cachelin, Sunnyvale, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/01 (2006.01); G06F 3/0346 (2013.01); G06T 17/20 (2006.01);
U.S. Cl.
CPC ...
G06T 17/205 (2013.01); G06F 3/011 (2013.01); G06F 3/0346 (2013.01); G06T 2210/36 (2013.01);
Abstract

A hierarchical sphere and/or hierarchical disk distribution is used to re-sample points of a point cloud to achieve a well distributed re-sampled point distribution. The re-sampled points are represented by integer values defining a given partition in which a respective re-sampled point resides and an index value. The index value identifies a sphere (or disk) within the given partition to which the re-sampled point belongs. The spatial location of the resampled point is determined based on the location of the partition to which the re-sampled point belongs and the location of a sample bin (e.g. sphere) in the partition having an index value communicated for the re-sampled point.


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