The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2024
Filed:
Apr. 24, 2023
Wevo, Inc., Boston, MA (US);
Dustin Garvey, Exeter, NH (US);
Janet Muto, Boston, MA (US);
Nitzan Shaer, Newton, MA (US);
Shannon Walsh, Boston, MA (US);
Alexa Stewart, Andover, MA (US);
Andrea Paola Aguilera Garcia, Cambridge, MA (US);
Kim Coccoluto, Wakefield, MA (US);
Sara Peters, Syracuse, NY (US);
Ruthie McCready, Austin, TX (US);
Kelly Lyons, Boston, MA (US);
Melany Carvalho, Pawtucket, RI (US);
Everett Granger, Virginia Beach, VA (US);
Julia McCarthy, Boston, MA (US);
Frank Chiang, Boston, MA (US);
Alexander Barza, Cambridge, MA (US);
Hannah Sieber, Mendon, MA (US);
Wevo, Inc., Boston, MA (US);
Abstract
Techniques are described herein for producing machine-generated findings given a set of user experience test results. In some embodiments, the system generates the findings using an artificial intelligence and machine learning engine. The findings may highlight areas that are predicted to provide the most insight into optimizing a product's design. A finding may be generated based on all or a subset of the test result elements, including qualitative and/or quantitative data contained therein. A finding may summarize a subset of the UX test results that are interrelated. A finding may link a summary to one or more references extracted from the set of test results to show support for the machine-generated insights in the underlying raw test data. Machine-generated findings reports may provide near instantaneous guidance for optimizing product designs while removing extraneous information from a vast quantity of raw test result data.