The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2024
Filed:
Aug. 31, 2021
Kabushiki Kaisha Toshiba, Tokyo, JP;
Ryusuke Hirai, Tokyo, JP;
Saori Asaka, Yokohama Kanagawa, JP;
Yukinobu Sakata, Kawasaki Kanagawa, JP;
Akiyuki Tanizawa, Kawasaki Kanagawa, JP;
KABUSHIKI KAISHA TOSHIBA, Tokyo, JP;
Abstract
According to one embodiment, a defect classification apparatus includes a processor. The processor acquires a first design image which is an image based on design data created by design software and relates to a first inspection target, and acquires a first real image which is captured by imaging the first inspection target produced based on the design data. The processor converts the first design image to a reference image represented by using a second real image captured by imaging a second inspection target without a defect. The processor calculates a reliability of the reference image. The processor detects a defect in the first inspection target by comparing the reference image and the first real image and classifies the defect, based on the reliability.