The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2024

Filed:

Mar. 26, 2021
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Yuichi Wakabayashi, Tokyo, JP;

Koji Wakimoto, Tokyo, JP;

Izumi Otsuka, Tokyo, JP;

Chikato Ishitobi, Tokyo, JP;

Takehisa Haraguchi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/15 (2006.01); G06F 17/18 (2006.01); G06F 18/2132 (2023.01); G08B 21/18 (2006.01);
U.S. Cl.
CPC ...
G06F 17/18 (2013.01); G06F 17/15 (2013.01); G06F 18/2132 (2023.01); G08B 21/18 (2013.01);
Abstract

There are included a normal model building unit that builds a normal model of another device on the basis of normal data of the other device; a degradation determination model building unit that builds a degradation determination model of the other device on the basis of the normal data and degradation data of the other device; a normal model rebuilding unit that builds a normal model of a target device on the basis of the normal model of the other device and normal data of the target device; a degradation determination model rebuilding unit that builds a degradation determination model of the target device on the basis of the degradation determination model of the other device and the normal model of the target device; and a degradation determining unit that determines degradation of the target device on the basis of operation data of the target device and the degradation determination model of the target device.


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