The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2024
Filed:
Feb. 20, 2020
Applicant:
Canon U.s.a., Inc., Melville, NY (US);
Inventors:
Kazunari Kawabata, Port Washington, NY (US);
Nikita Spirin, Natick, MA (US);
Vladimir Chernykh, Moscow, RU;
German Novikov, Moscow, RU;
Junko Tajima, Kanagawa, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/583 (2019.01); G06F 16/535 (2019.01); G06F 16/58 (2019.01); G06N 20/00 (2019.01); G06V 10/25 (2022.01); G06V 10/776 (2022.01); G06V 10/80 (2022.01);
U.S. Cl.
CPC ...
G06F 16/583 (2019.01); G06F 16/535 (2019.01); G06F 16/5866 (2019.01); G06N 20/00 (2019.01); G06V 10/25 (2022.01); G06V 10/776 (2022.01); G06V 10/809 (2022.01);
Abstract
An image processing method and apparatus is provided for obtaining an image captured by an image capturing apparatus; determining characteristic data of the captured image based on inputting the obtained image into an image analysis model trained with images including a predetermined type of characteristic data; and identifying, based on the determination performed by the image analysis model, metadata including a numeric value regarding the predetermined type of the captured image.