The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2024

Filed:

Oct. 08, 2021
Applicant:

Business Object Software Ltd, Dublin, IE;

Inventors:

Paul O'Hara, Dublin, IE;

Malte Christian Kaufmann, Dublin, IE;

Alan McShane, Dublin, IE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/23 (2019.01); G06F 16/215 (2019.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G06F 16/2365 (2019.01); G06F 16/215 (2019.01); G06F 17/18 (2013.01);
Abstract

The present disclosure provides for accurate and efficient identification of candidate features for an input dataset comprising one or more continuous features and one or more categorical features is obtained. A number of categorical feature categories based on the one or more categorical features is determined. Record counts for each of the categorical feature categories are determined. Skew statistics for each category are determined based on the record counts for each of the categorical feature categories. Cardinality skew factors for each of the one or more categorical features are then determined based on the record counts and the skew statistics. A number of the one or more categorical features having the highest cardinality skew factors are selected from among the cardinality skew factors. Then, a top contributor deviation analysis is performed using the selected number of the categorical features having the highest cardinality skew factors.


Find Patent Forward Citations

O'Hara, Paul. (2024). Feature selection for deviation analysis (U.S. Patent No. 12079196). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12079196

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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