The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2024

Filed:

Mar. 03, 2023
Applicant:

Accenture Global Solutions Limited, Dublin, IE;

Inventors:

Makoto Murai, Tokyo, JP;

Shin Moriga, Tokyo, JP;

Atsushi Suyama, Tokyo, JP;

Motoaki Hayashi, Tokyo, JP;

Takuya Kudo, Kirkland, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G05B 23/024 (2013.01); G05B 23/0232 (2013.01); G05B 23/0237 (2013.01);
Abstract

The present disclosure describes a method of controlling a manufacturing system using multivariate time series and includes storing recording data as a plurality of time series, each time series having a first recorded value and a final recorded value, interpolating, within a first time window, missing values in the plurality of time series using a Bayesian model, the missing values falling between a first and an end time of the respective time series, storing the interpolated values as prediction data, each interpolated value including an uncertainty, loading recorded data of a second time window, loading prediction data of the second time window, predicting, using the Bayesian model, values for each time series that is absent recorded data and prediction data, storing the predicted values, each prediction value including an uncertainty, and adjusting a device that generates the recorded data based on the prediction values within the second time window.


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