The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2024
Filed:
Oct. 08, 2020
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Frank Gumbmann, Nuremberg, DE;
Benedikt Simper, Munich, DE;
Gerhard Hamberger, Griesstaett, DE;
Andreas Vonloesecke, Tutzing, DE;
Matthias Beer, Neubiberg, DE;
ROHDE & SCHWARZ GMBH & CO. KG, Munich, DE;
Abstract
An imaging system for material characterization of a sample is provided. Said imaging system comprises at least two imaging arrays configured to form at least one imaging array pair. In this context, the imaging system is configured to perform at least one reflection measurement with the aid of at least one imaging array. Furthermore, the imaging system is configured to perform at least one transmission measurement with the aid of the at least one imaging array pair. In addition to this, the imaging system is configured to determine material characteristics of the sample on the basis of the at least one reflection measurement and/or the at least one transmission measurement.