System and method for device under test (dut) validation reuse across multiple platforms

Abstract

A new approach is proposed to support device under test (DUT) validation reuse across a plurality of platforms, e.g., hardware simulation, hardware emulation, and post-silicon validation. First, an inference profile used for an inference operation of an application, e.g., a machine learning (ML) application, is generated based on a set of profile configurations, a set of test parameters, and a set of randomized constraints. A plurality of math functions specified by, e.g., an architecture team, for the ML application are also statically and/or dynamically verified via block simulation and/or formal verification. An inference model for the DUT is then built based on the inference profile and the plurality of verified math functions. Finally, an inference database including one or more of stimulus, DUT configurations, input data and predicted output results is generated based on the inference model, wherein the inference database for the DUT is reusable across the plurality of platforms.