The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2024

Filed:

Mar. 19, 2020
Applicant:

Sysmex Corporation, Kobe, JP;

Inventors:

Masaki Shiba, Kobe, JP;

Hiroki Kotake, Kobe, JP;

Akihito Kato, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Kobe, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 33/49 (2006.01); G01N 35/02 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00871 (2013.01); G01N 33/4905 (2013.01); G01N 35/025 (2013.01); G01N 35/1065 (2013.01); G01N 35/1081 (2013.01); G01N 2035/00346 (2013.01);
Abstract

Disclosed is a sample measurement device comprising a first processing unit that performs a first measurement on a sample contained in a first container in a first cycle; a second processing unit that performs a second measurement on a sample contained in a second container in a second cycle different from the first cycle; and a relay section which is disposed between the first processing unit and the second processing unit and in which the second container is positioned, wherein the first processing unit performs a transferring operation of transferring the second container to the relay section, and the second processing unit performs a receiving operation of receiving the second container that has been transferred to the relay section from the relay section.


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