The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2024
Filed:
Apr. 15, 2020
The Regents of the University of California, Oakland, CA (US);
R. Michael van Dam, Sherman Oaks, CA (US);
Jia Wang, Los Angeles, CA (US);
Alejandra Rios, Los Angeles, CA (US);
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA, Oakland, CA (US);
Abstract
A method of performing high-throughput radio thin layer chromatography (radio-TLC) includes spotting a plurality of locations on one or more TLC plates with samples containing a radiochemical or a radiopharmaceutical, each location defining an individual lane on the one or more TLC plates for the respective samples. The one or more TLC plates are developed with a developing solution and dried. The TLC plates are imaged with an imaging device comprising a camera, wherein the image obtained from the camera comprises a field of view that contains regions of interest (ROIs) from the plurality of lanes. The ROIs in the images obtained from the camera may then be analyzed by the user. The ROIs may be used, for example, reaction optimization or for quality control check of the production of radiotracers.