The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2024
Filed:
Jan. 25, 2022
Applicant:
Atonarp Inc., Tokyo, JP;
Inventor:
Naoki Takahashi, Tokyo, JP;
Assignee:
ATONARP INC., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); G01N 27/623 (2021.01); H01J 49/04 (2006.01); H01J 49/10 (2006.01); H01J 49/42 (2006.01);
U.S. Cl.
CPC ...
G01N 27/623 (2021.01); H01J 49/0422 (2013.01); H01J 49/105 (2013.01); H01J 49/421 (2013.01); H01J 49/429 (2013.01);
Abstract
A gas analyzing apparatus includes: an ionization device that generates an ion flow of a sample gas; an analyzer that analyzes the ion flow supplied from the ionization device; a first ion path that non-linearly guides the ion flow from the ionization device to an inlet of the analyzer; and a blocking device for intermittently blocking and releasing, using an electric field or a magnetic field, the ion flow on at least part of a path of the ion flow through the first ion path to a mass filter of the analyzer. It is possible to perform measurement in a state where the ion flow is blocked and measurement in a state where the ion flow is not blocked.