The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2024

Filed:

Aug. 27, 2019
Applicant:

Nippon Telegraph and Telephone Corporation, Tokyo, JP;

Inventors:

Tomohiro Taniguchi, Musashino, JP;

Kazutaka Hara, Musashino, JP;

Atsuko Kawakita, Musashino, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/21 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G01N 21/21 (2013.01); G01N 2021/1744 (2013.01); G01N 2021/1793 (2013.01);
Abstract

An objective of the present invention is to provide an optical measurement device capable of performing remote optical measurement. An optical measurement device may include a light source that generates irradiation light with a beam shape, a beam control unit configured to control an irradiation direction of the irradiation light L, a condensing unit configured to condense returned light generated by irradiating a part of a measurement target with the irradiation light, and a detection unit configured to detect information regarding the measurement target included in the returned light condensed by the condensing unit. The beam control unit can control the irradiation direction of the irradiation light for measurement to any direction, and thus the condensing unit can efficiently receive the faint returned light from the measurement target.


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