The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2024

Filed:

Jan. 16, 2020
Applicant:

Sony Group Corporation, Tokyo, JP;

Inventor:

Yoshiki Okamoto, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/1434 (2024.01); G01N 15/14 (2024.01); G01N 15/149 (2024.01); G02B 3/00 (2006.01); G02B 13/14 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1434 (2013.01); G02B 3/0006 (2013.01); G02B 13/143 (2013.01); G01N 15/149 (2024.01); G01N 2015/1493 (2013.01);
Abstract

To provide a microparticle measurement technology capable of supporting excitation light in a wideband wavelength range. The present technology provides a microparticle measurement device provided with a plurality of objective lenses for excitation light irradiation used for irradiating microparticles flowing through a flow path with excitation light, in which at least one of the objective lenses for excitation light irradiation is used for detecting scattered light emitted from the microparticles by the excitation light with which the microparticles are irradiated through another one of the objective lenses for excitation light irradiation.


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