The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2024
Filed:
Aug. 25, 2021
Fujifilm Business Innovation Corp., Tokyo, JP;
Kenta Ogata, Kanagawa, JP;
Kouhei Yukawa, Kanagawa, JP;
FUJIFILM Business Innovation Corp., Tokyo, JP;
Abstract
A measurement device includes: a first measurement unit, disposed at a first opposing position facing a portion of a sheet-like measurement target, that measures a first physical property of the measurement target by causing the measurement target to vibrate with an ultrasonic wave; a second measurement unit, disposed at a second opposing position facing another portion of the measurement target in a state in which the first measurement unit is facing the first portion, that pinches and restrains the other portion in a thickness direction and measures a second physical property other than the first physical property of the measurement target; and a disposed unit disposed between the first measurement unit and the second measurement unit in an intersecting direction with respect to the thickness direction of the measurement target.