The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2024
Filed:
Jun. 15, 2022
Universität Stuttgart, Stuttgart, DE;
Universität Stuttgart, Stuttgart, DE;
Abstract
The present invention relates to a measuring device () and a method for determining a depth of field of an optical structure (). In this case, the measuring device comprises a device body () with a measuring axis (), the device body () being formed such that, in a measuring position, it can be placed in a stationary manner on a deposit plane of the optical structure such that the measuring axis () of the device body () coincides with an optical axis of the optical structure, wherein the device body () has a measurement scale () arranged along a scale line () such that the scale line () encloses with the direction of the measuring axis () a scale angle φ greater than 0° and less than 90° and the measurement scale () can be optically detected in the measuring position of the device body () by the optical structure () for determining the depth of field.