The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2024
Filed:
Sep. 26, 2019
Fuji Corporation, Chiryu, JP;
Takumi Azuma, Chiryu, JP;
Nobuo Oishi, Kosai, JP;
FUJI CORPORATION, Chiryu, JP;
Abstract
A height measurement device images a target, extracts a contour of the target from a two-dimensional image, sets a circumscribed rectangular area of which each side is parallel to a corresponding side of the visual field of the camera and each side is circumscribed with the extracted contour of the target, and sets an extension area in which each of four sides of the set circumscribed rectangular area is extended outward by a predetermined amount. The height measurement device determines multiple imaging positions such that maximum parallax is obtained within a range where the extension area does not protrude from the visual field of the camera. Then, the height measurement device images the target at each of the determined multiple imaging positions, and estimates a height of the target from parallax of a two-dimensional image of the target imaged at each of the multiple imaging positions.