The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2024

Filed:

Sep. 15, 2020
Applicant:

Uster Technologies Ag, Uster, CH;

Inventors:

Ulf Schneider, Uster, CH;

Mario Siegenthaler, Herdern, CH;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
D01G 31/00 (2006.01); D01H 13/22 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
D01H 13/22 (2013.01); D01G 31/003 (2013.01); G06T 7/001 (2013.01); G06T 2207/30124 (2013.01);
Abstract

The invention relates to a method for optimizing a yarn production process in which foreign materials () are monitored in a textile fiber formation (). The textile fiber formation () is illuminated with electromagnetic radiation from at least two color ranges. The foreign materials () are classified into different color classes according to their colors. If a sufficiently large random sample with classified foreign materials () is available, a frequency distribution of the foreign materials is determined for the color classes and compared with a reference frequency distribution. If the determined frequency distribution deviates from the reference frequency distribution, at least one of a set of multiple optimization actions is performed, e.g., a warning signal is output.


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