The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2024

Filed:

Dec. 18, 2020
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Tsung-Ting Tsai, New Taipei, TW;

Carlos Andres Betancourt Baca, New Taipei, TW;

Yen-Chung Chang, Hsinchu County, TW;

Ching-Yi Liu, Taichung, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B66F 9/06 (2006.01); B66F 9/075 (2006.01); G05B 13/02 (2006.01); G05D 1/00 (2024.01); G06V 10/44 (2022.01); G06V 20/56 (2022.01);
U.S. Cl.
CPC ...
B66F 9/063 (2013.01); B66F 9/0755 (2013.01); G05B 13/0265 (2013.01); G05D 1/0253 (2013.01); G06V 10/44 (2022.01); G06V 20/56 (2022.01);
Abstract

A method and a system for controlling a handling machine, and a non-volatile computer readable recording medium are provided. The method includes: analyzing image data to obtain contour data corresponding to a target in the image data; analyzing the contour data to obtain feature data, where the feature data reflects the position of the target in the physical space; and generating control data based on the feature data, where the control data is adapted to control the handling machine to transport the target in response to the position of the target in the physical space.


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