The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2024

Filed:

Feb. 01, 2022
Applicant:

Pfu Limited, Kahoku, JP;

Inventor:

Masaaki Sakai, Kahoku, JP;

Assignee:

PFU LIMITED, Kahoku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B65H 7/12 (2006.01);
U.S. Cl.
CPC ...
B65H 7/125 (2013.01); B65H 2511/12 (2013.01); B65H 2511/524 (2013.01); B65H 2553/30 (2013.01); B65H 2801/03 (2013.01);
Abstract

A medium conveying apparatus includes a conveying roller to convey a medium, a width detection sensor for detecting a width of the medium conveyed by the conveying roller in a direction perpendicular to a conveying direction, an overlap detection sensor for detecting an overlap of the medium conveyed by the conveying roller, and a processor to determine whether to execute an abnormality processing for a multi-feed, based on the width of the medium acquired based on a detection result by the width detection sensor and a detection result by the overlap detection sensor. The processor acquires an overlap detection width being a width in which the medium is estimated to overlap in the direction perpendicular to the conveying direction, based on the detection result by the overlap detection sensor. The processor executes the abnormality processing when the width of the medium and the overlap detection width are equal.


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