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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12076724 B1

PDFFull Text
Date of Patent:
Sep. 03, 2024

Filed:

Aug. 20, 2020

Specimen processing apparatus, specimen measurement system and method for processing specimen

Applicant:

Sysmex Corporation, Kobe, JP;

Inventors:

Kazuhiro Yamada, Kobe, JP;

Kazuki Asao, Kobe, JP;

Keisuke Kuwano, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Kobe, JP;

Attorneys:

METROLEX IP LAW GROUP, PLLC

Robert L. Scott, Esq

Primary Examiner:

Samuel P Siefke

Assistant Examiner:

Henry H Nguyen

Int. Cl.
CPC ...
B01L 3/00 (2006.01); B01L 9/06 (2006.01); G01N 21/01 (2006.01); G01N 21/64 (2006.01); G01N 21/85 (2006.01); G01N 33/49 (2006.01);
U.S. Cl.
CPC ...
B01L 3/5085 (2013.01); B01L 9/06 (2013.01); G01N 21/01 (2013.01); G01N 21/6428 (2013.01); G01N 21/85 (2013.01); G01N 33/4915 (2013.01); B01L 2200/025 (2013.01); B01L 2200/143 (2013.01); B01L 2300/0627 (2013.01); G01N 2021/6439 (2013.01); G01N 2201/06113 (2013.01); G01N 2201/0633 (2013.01); G01N 2201/0636 (2013.01);
Abstract

A specimen processing apparatus performs processing on a specimen contained in a container. The specimen processing apparatus includes: holders having different shapes, each of the holders being configured to hold the container; a holder placement unit that comprises holder receiving portions having different shapes, the shapes of the holder receiving portions corresponding to the shapes of the holders; and a specimen processing unit that performs processing on the specimen contained in the container held by one of the holders placed on the holder placement unit.

Find Patent Forward Citations

Yamada, Kazuhiro. (2024). Specimen processing apparatus, specimen measurement system and method for processing specimen (U.S. Patent No. 12076724). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12076724

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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