The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2024
Filed:
Apr. 25, 2023
Align Technology, Inc., San Jose, CA (US);
Yuxiang Wang, Newark, CA (US);
Andrew Jang, San Mateo, CA (US);
Bruce Cam, San Jose, CA (US);
Rohit Tanugula, San Jose, CA (US);
Chunhua Li, Cupertino, CA (US);
Jun Sato, San Jose, CA (US);
Luyao Cai, Santa Clara, CA (US);
Pavel Pokotilov, Santa Clara, CA (US);
Kangning Su, Arlington, VA (US);
John Y. Morton, San Jose, CA (US);
Align Technology, Inc., San Jose, CA (US);
Abstract
Methods for designing orthodontic appliances are provided. In some embodiments, a method includes receiving a treatment plan for a patient's dentition and generating an aligner model representing an aligner configured to implement a treatment stage of the treatment plan. The aligner model can include a thickness map having a thickness parameter for each location of the aligner model. The method can include adjusting the thickness map by using the aligner model to evaluate an outcome when the aligner is applied to the patient's dentition, and iteratively reducing the value of each thickness parameter of the thickness map based on the evaluation until a resulting thickness is determined for each thickness parameter. The method can also include providing instructions to manufacture the aligner based on the aligner model with the resulting thickness for each thickness parameter of the thickness map.