The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2024
Filed:
Sep. 27, 2019
Paris Sciences ET Lettres-quartier Latin, Paris, FR;
Centre National DE LA Recherche Scientifique (Cnrs), Paris, FR;
Ecole Superieure DE Physique ET DE Chimie Industrielles DE LA Ville DE Paris, Paris, FR;
Viacheslav Mazlin, Villebon-sur-Yvette, FR;
Peng Xiao, Guangzhou, CN;
Mathias Fink, Meudon, FR;
Albert Claude Boccara, Paris, FR;
Abstract
According to one aspect, the invention relates to a system () for in vivo, full-field interference microscopy imaging of a scattering three-dimensional sample. It comprises a full-field OCT imaging system () for providing en face images of the sample, wherein said full-field OCT system comprises an interference device () with an object arm () intended to receive the sample and a reference arm () comprising an optical lens () and a first reflection surface (), and an acquisition device () configured to acquire a temporal succession of two-dimensional interferometric signals (I, I) resulting from interferences produced at each point of an imaging field; an OCT imaging system () for providing at the same times of acquisition of said two-dimensional interferometric signals, cross-sectional images of both the sample and a first reflection surface () of said full-field OCT imaging system (); a processing unit () configured to determine a plurality of en face images (X-Y) of a plurality of slices of the sample, each en face image being determined from at least two two-dimensional interferometric signals (I, I) having a given phase shift; determine from the cross-sectional images provided by the OCT imaging system () at the times of acquisition of each of said two two-dimensional interferometric signals (I, I) a depth (z) for each en face image (X-Y) of said plurality of slices; determine a 3D image of the sample from said plurality of en face images of said plurality of slices of the sample and depths.