The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2024
Filed:
Dec. 07, 2020
Alcon Inc., Fribourg, CH;
John Alfred Campin, Southlake, TX (US);
Martin Gruendig, Rangsdorf, DE;
Christopher Sean Mudd, Lake Forest, CA (US);
George Hunter Pettit, Fort Worth, TX (US);
Peter Zieger, Berlin, DE;
Alcon Inc., Fribourg, CH;
Abstract
A method of verifying ophthalmic measurements includes obtaining, via an ophthalmic measurement device, a first measurement of at least one ophthalmic parameter over a first measurement area. The first measurement area corresponds to an unassisted visible area of a patient's eye. A second measurement of the at least one ophthalmic parameter over a second measurement area is obtained via the measurement device. The second measurement area corresponds to an assisted visible area of the patient's eye. The first measurement is compared to the second measurement. It is determined if the second measurement diverges from the first measurement. Responsive to a determination that the second measurement diverges from the first measurement, an alert that the second measurement is inaccurate is generated. Responsive to a determination that the second measurement does not diverge from the first measurement, the second measurement is accepted as accurate.