The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2024

Filed:

Dec. 18, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Toshiyuki Tamura, Tokyo, JP;

Tsuyoshi Takakura, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 12/06 (2021.01); H04W 76/30 (2018.01); H04W 84/04 (2009.01);
U.S. Cl.
CPC ...
H04W 12/06 (2013.01); H04W 76/30 (2018.02); H04W 84/042 (2013.01);
Abstract

In response to a failure of a re-authentication and re-authorization procedure for a first network slice identifier currently allowed to a UE (), the AMF node () initiates a release procedure to release a Protocol Data Unit (PDU) session associated with the first network slice identifier. This, for example, allows the AMF to appropriately manage a network slice configuration stored in the UE.


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Tamura, Toshiyuki. (2024). Amf node and method thereof (U.S. Patent No. 12075241). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12075241

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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