The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2024

Filed:

Feb. 07, 2022
Applicant:

Hitachi Metals, Ltd., Tokyo, JP;

Inventors:

Seiichi Kashimura, Tokyo, JP;

Kazufumi Suenaga, Tokyo, JP;

Tamotsu Kibe, Tokyo, JP;

Kanako Suganuma, Tokyo, JP;

Assignee:

Proterial, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01B 7/17 (2006.01); C09D 5/32 (2006.01); C09D 7/61 (2018.01); C09D 183/00 (2006.01);
U.S. Cl.
CPC ...
H01B 7/17 (2013.01); C09D 5/32 (2013.01); C09D 7/61 (2018.01); C09D 183/00 (2013.01);
Abstract

A laminate structure includes a first layer as a substrate and a second layer provided on the first layer. The second layer is composed of a rubber composition including a rubber component, first fine particles for providing a surface with irregularity, and second fine particles for shielding UV-C light. When performing Raman mapping analysis on a first peak derived from oscillation of the second fine particles in Raman scattering spectrum obtained by Raman scattering measurement of the second layer, the second layer includes a region where an intensity of the first peak is greater in an area where the first fine particles are not present than an area where the first fine particles are present.


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