The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2024

Filed:

Jul. 18, 2019
Applicant:

Our United Corporation, Xi'an, CN;

Inventors:

Jiuliang Li, Xi'an, CN;

Zhongya Wang, Xi'an, CN;

Hao Yan, Xi'an, CN;

Chun Luo, Xi'an, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/70 (2017.01); A61N 5/10 (2006.01); G06T 7/30 (2017.01);
U.S. Cl.
CPC ...
G06T 7/70 (2017.01); A61N 5/1077 (2013.01); G06T 7/30 (2017.01); G06T 2207/10116 (2013.01); G06T 2207/30096 (2013.01);
Abstract

Provided is a method for locating a tumor. The method includes: performing image registration on a projection image of the tumor and a first standard image to acquire a first offset; generating a second standard image based on the first offset; performing image registration on the projection image and the second standard image to acquire a second offset; and updating the second standard image based on the second offset and executing the operation of image registration on the projection image and the second standard image again in response to the second offset satisfying a virtual re-sampling condition; or outputting an accumulated offset in response to the second offset not satisfying the virtual re-sampling condition, wherein the accumulated offset is a sum of the first offset and the second offset acquired by executing the operation of image registration.


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