The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2024

Filed:

Feb. 08, 2022
Applicant:

GM Global Technology Operations Llc, Detroit, MI (US);

Inventors:

Zerun Ma, Shanghai, CN;

Guangze Li, Novi, MI (US);

Hui-ping Wang, Troy, MI (US);

Yan Cai, Shanghai, CN;

Blair E. Carlson, Ann Arbor, MI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01B 11/22 (2006.01); G01N 21/95 (2006.01); G01N 33/207 (2019.01); G06T 7/521 (2017.01); H04N 23/56 (2023.01); H04N 23/90 (2023.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G01B 11/22 (2013.01); G01N 21/95 (2013.01); G01N 33/207 (2019.01); G06T 7/521 (2017.01); H04N 23/56 (2023.01); H04N 23/90 (2023.01); G06T 2207/20081 (2013.01);
Abstract

A system for inspecting a reflective surface includes a first imaging assembly configured to take a first image of the reflective surface. The first image includes depth information. The system also includes a second imaging assembly configured to take a second image of the reflective surface. The second image includes contrast information. The system further includes a processor configured to acquire the first image and the second image, estimate a depth profile of the surface based on the depth information, correlate the depth profile with the second image, and identify a feature of the reflective surface based on the correlation.


Find Patent Forward Citations

Loading…