The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2024

Filed:

Mar. 16, 2021
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Andrew Kinai, Nairobi, KE;

Navin Twarakavi, Karnataka, IN;

Fred Ochieng Otieno, Nairobi, KE;

Kamal Chandra Das, New Delhi, IN;

Shantanu R. Godbole, Bangalore, IN;

Komminist Weldemariam, Ottawa, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/1093 (2023.01); G06N 5/04 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06Q 10/1095 (2013.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01);
Abstract

A system, computer program product, and method are presented for forecasting a spatio-temporal calendar including predicted regions of interest based on time dependent factors such as long-term weather predictions, time-independent factors, and travel constraints. The method includes collecting information and constraints with respect to service visits. At least a portion of the collected information and constraints are directed toward weather and climate. The method also includes predicting weather and climate impacts on at least one geographical region of interest. The method further includes predicting, subject to the predictions of weather and climate impacts, one or more locations of interest within the at least one geographical region of interest that would be impacted by one or more service visits. The method also includes generating one or more spatio-temporal calendars that include the one or more locations of interest scheduled for the one or more service visits.


Find Patent Forward Citations

Loading…