The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2024

Filed:

Feb. 17, 2020
Applicant:

Purdue Research Foundation, West Lafayette, IN (US);

Inventors:

David Scott Ebert, West Lafayette, IN (US);

Abish Malik, West Lafayette, IN (US);

Sherry Towers, Tempe, AZ (US);

Ross Maciejewski, Phoenix, AZ (US);

Assignee:

Purdue Research Foundation, West Lafayette, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06Q 10/06 (2023.01);
U.S. Cl.
CPC ...
G06Q 10/06 (2013.01); G06N 20/00 (2019.01);
Abstract

Disclosed herein is a visual analytics system and method that provides a proactive and predictive environment in order to assist decision makers in making effective resource allocation and deployment decisions. The challenges involved with such predictive analytics processes include end-users' understanding, and the application of the underlying statistical algorithms at the right spatiotemporal granularity levels so that good prediction estimates can be established. In the disclosed approach, a suite of natural scale templates and methods are provided allowing users to focus and drill down to appropriate geospatial and temporal resolution levels. The disclosed forecasting technique is based on the Seasonal Trend decomposition based on Loess (STL) method applied in a spatiotemporal visual analytics context to provide analysts with predicted levels of future activity. A novel kernel density estimation technique is also disclosed, in which the prediction process is influenced by the spatial correlation of recent incidents at nearby locations.


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