The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2024
Filed:
Sep. 29, 2020
Basf SE, Ludwigshafen am Rhein, DE;
Aitor Alvarez Gila, Derio, ES;
Amaia Maria Ortiz Barredo, Vitoria-Gasteiz, ES;
David Roldan Lopez, Dos Hermanas, ES;
Javier Romero Rodriguez, Utrera, ES;
Corinna Maria Spangler, Ludwigshafen, DE;
Christian Klukas, Limburgerhof, DE;
Till Eggers, Ludwigshafen, DE;
Jone Echazarra Huguet, Derio, ES;
Ramon Navarra Mestre, Limburgerhof, DE;
Artzai Picon Ruiz, Derio, ES;
Aranzazu Bereciartua Perez, Derio, ES;
BASF SE, Ludwigshafen am Rhein, DE;
Abstract
Quantifying plant infestation is performed by estimating the number of biological objects () on parts () of a plant (). A computer () receives a plant-image () taken from a particular plant (). The computer () uses a first convolutional neural network () to derive a part-image () that shows a part of the plant. The computer () splits the part-image into tiles and uses a second network to process the tiles to density maps. The computer () combines the density maps to a combined density map in the dimension of the part-image and integrates the pixel values to an estimate number of objects for the part. Object classes ((),()) can be differentiated to fine-tune the quantification to identify class-specific countermeasures.