The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2024

Filed:

Jun. 15, 2022
Applicant:

Hand Held Products, Inc., Charlotte, NC (US);

Inventors:

Benjamin Hejl, Cherry Hill, NJ (US);

David Wilz, Sewell, NJ (US);

Erik Van Horn, Seaville, NJ (US);

Assignee:

HAND HELD PRODUCTS, INC., Charlotte, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/10 (2006.01); G06K 7/14 (2006.01);
U.S. Cl.
CPC ...
G06K 7/10821 (2013.01); G06K 7/1413 (2013.01);
Abstract

Various embodiments described herein relate to calibration for scanning device decoding based on aimer pattern detection. In this regard, a first image frame captured using a scanning device is decoded. The first image frame is related to an object associated with a barcode. Additionally, a second image frame related to the object associated with the barcode is capture using the scanning device. The second image frame comprises an aimer pattern generated by an aimer of the scanning device. A location of the aimer pattern in the second image frame is determined based on a motion transform correlation between the barcode in the first image frame and the aimer pattern in the second image frame. Additionally, an aiming position of the aimer is calibrated based on the location of the aimer pattern determined by the motion transform correlation.


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