The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2024
Filed:
Apr. 25, 2023
Applicant:
Datamax-o'neil Corporation, Altamonte Springs, FL (US);
Inventors:
H Sprague Ackley, Seattle, WA (US);
Si Qian, Jiangsu, CN;
Thomas Axel Jonas Celinder, Singapore, SG;
Sebastien D'Armancourt, Singapore, SG;
Assignee:
Datamax-O'Neil Corporation, Altamonte Springs, FL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/10 (2006.01); G06K 5/00 (2006.01); G06K 7/14 (2006.01); G06K 19/06 (2006.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
G06K 7/10673 (2013.01); G06K 5/00 (2013.01); G06K 7/10851 (2013.01); G06K 7/14 (2013.01); G06K 19/06009 (2013.01); H04N 1/00045 (2013.01); H04N 1/00334 (2013.01); H04N 1/00363 (2013.01);
Abstract
Techniques for characterizing an optical system (for example, a printer verifier) are provided. In this regard, the optical system may be characterized for scanning a printed image. The characterization of the optical system includes determining an effective aperture size of the optical system, and correspondingly an effective resolution at which the optical system can be configured to scan a portion of the printed image according to verification requirements.