The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2024
Filed:
Jul. 09, 2021
Siemens Aktiengesellschaft, Munich, DE;
Christian Knierim, Munich, DE;
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Abstract
A method for expanded integrity monitoring of a container image, wherein the container image contains at least two layers, a base image and at least one application layer, which carries out at least one modification operation on the base image, includes the following steps: during assembly of the container image, allocating an integrity rule specific to the layer to the layer, for at least one of the layers of the container image, providing the container image and the allocated integrity rules to a guest computer, and—generating a container instance on the basis of the container image via a real-time environment of the guest computer, checking each individual layer in relation to the allocated integrity rules during execution of the container instance in the real-time environment, and—executing the layer according to the allocated layer-specific integrity rule.