The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2024
Filed:
Aug. 07, 2019
Applicant:
Nec Corporation, Tokyo, JP;
Inventors:
Jun Nishioka, Tokyo, JP;
Yoshiaki Sakae, Tokyo, JP;
Kazuhiko Isoyama, Tokyo, JP;
Takashi Konashi, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); G06F 21/31 (2013.01); G06F 21/78 (2013.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 21/31 (2013.01); G06F 21/78 (2013.01);
Abstract
A policy evaluation apparatus () acquires, with respect to each of a plurality of control groups () including an evaluation target group, control policies (). Each of the control policy () indicates execution permission/non-permission of an application. Further, the policy evaluation apparatus () compares an evaluation target policy being the control policy () of the evaluation target group with other plurality of control policies (), and generates evaluation information () based on the comparison result.