The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2024

Filed:

Feb. 22, 2023
Applicant:

Synaptics Incorporated, San Jose, CA (US);

Inventors:

Tom Vandermeijden, San Jose, CA (US);

Guozhong Shen, Fremont, CA (US);

Assignee:

Synaptics Incorporated, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/16 (2006.01); G01B 7/30 (2006.01); G06F 3/044 (2006.01);
U.S. Cl.
CPC ...
G06F 1/1677 (2013.01); G01B 7/30 (2013.01); G06F 1/1616 (2013.01); G06F 3/0446 (2019.05);
Abstract

A system for determining a fold angle of a foldable device includes a plurality of electrodes and a processing system. The processing system is configured to: determine a first detected temperature at a first time; obtain baseline reference absolute capacitance measurements associated with the first detected temperature and associated with a known fold angle of the foldable device; determine a second detected temperature at a second time later than the first time; obtain absolute capacitance measurements associated with the second detected temperature at the second time; generate updated baseline reference absolute capacitance measurements based on the obtained capacitive measurements associated with the second detected temperature at the second time; obtain absolute capacitance measurements at a third time later than the second time; and determine the fold angle of the foldable device based on the absolute capacitance measurements obtained at the third time and the updated baseline reference absolute capacitance measurements.


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