The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2024

Filed:

Jan. 11, 2021
Applicant:

Brain Corporation, San Diego, CA (US);

Inventors:

David Ross, San Diego, CA (US);

Botond Szatmary, San Diego, CA (US);

Assignee:

Brain Corporation, San Diego, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05D 1/00 (2024.01); B25J 9/16 (2006.01); B25J 13/08 (2006.01); G06V 10/22 (2022.01); G06V 10/44 (2022.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01); G06V 10/94 (2022.01); G06V 20/10 (2022.01); G06V 20/52 (2022.01); G06V 20/68 (2022.01);
U.S. Cl.
CPC ...
G05D 1/0274 (2013.01); B25J 9/161 (2013.01); B25J 9/1653 (2013.01); B25J 9/1697 (2013.01); B25J 13/089 (2013.01); G06V 10/235 (2022.01); G06V 10/454 (2022.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01); G06V 10/95 (2022.01); G06V 20/10 (2022.01); G06V 20/52 (2022.01); G06V 20/68 (2022.01);
Abstract

Systems and methods for detection of features within data collected by a plurality of robots by a centralized server are disclosed herein. According to at least one non-limiting exemplary embodiment, a plurality of robots may be utilized to collect a substantial amount of feature data using one or more sensors coupled thereto, wherein use of the plurality of robots to collect the feature data yields accurate localization of the feature data and consistent acquisition of the feature data. Systems and methods disclosed herein further enable a cloud server to identify a substantial number of features within the acquired feature data for purposes of generating insights. The substantial number of features far exceed a practical number of features of which a single neural network may be trained to identify.


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