The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2024
Filed:
Nov. 20, 2020
Applicants:
Alexander A. Ukhanov, Albuquerque, NM (US);
Gennady a Smolyakov, Albuquerque, NM (US);
Fei Hung Chu, Albuquerque, NM (US);
Inventors:
Alexander A. Ukhanov, Albuquerque, NM (US);
Gennady A Smolyakov, Albuquerque, NM (US);
Fei Hung Chu, Albuquerque, NM (US);
Assignee:
ACTOPROBE LLC, Albuquerque, NM (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 60/06 (2010.01); C12Q 1/6869 (2018.01); G01N 21/65 (2006.01); H01S 5/06 (2006.01); H01S 5/34 (2006.01); H01S 5/343 (2006.01);
U.S. Cl.
CPC ...
G01Q 60/06 (2013.01); C12Q 1/6869 (2013.01); G01N 21/65 (2013.01); H01S 5/0601 (2013.01); H01S 5/3402 (2013.01); H01S 5/343 (2013.01);
Abstract
A new integrated III-V/silicon Atomic Force Microscopy (AFM) active optical probe integrates a III-V semiconductor laser source and a silicon cantilever AFM probe into a robust easy-to-use single III-V/silicon chip to enable AFM measurements, optical imaging, and spectroscopy at the nanoscale.