The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2024
Filed:
May. 08, 2019
Shimadzu Corporation, Kyoto, JP;
Fujitsu Limited, Kawasaki, JP;
Yohei Yamada, Kyoto, JP;
Shinji Kanazawa, Kyoto, JP;
Hiroyuki Yasuda, Kyoto, JP;
Akihiro Kunisawa, Kyoto, JP;
Yuzi Kanazawa, Tokyo, JP;
Yusuke Hida, Atsugi, JP;
SHIMADZU CORPORATION, Kyoto, JP;
FUJITSU LIMITED, Kawasaki, JP;
Abstract
An analyzer configured to acquire a chromatogram or spectrum by performing a predetermined analysis of a sample and perform a qualitative or quantitative analysis of components contained in the sample. The analyzer includes: a peak detection unit configured, based on information regarding a plurality of target components that need to be checked whether contained in the sample or that need to be quantified, to detect a peak or peaks in the chromatogram or spectrum acquired by the predetermined analysis of the sample corresponding to one of the target components, configured to acquire peak information regarding each of the peak or peaks, and configured to obtain confidence information for each of the peak or peaks, the confidence information being an indicative value of certainty of detecting a peak; and a display processing unit configured to display on a display unit a list of at least a part of the target components.