The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2024
Filed:
Nov. 18, 2019
Universiteit Leiden, Leiden, NL;
Thomas Hankemeier, Leiden, NL;
Anne Charlotte Dubbelman, Leiden, NL;
Amy C. Harms, Leiden, NL;
Oskar González, Leiden, NL;
UNIVERSITEIT LEIDEN, Leiden, NL;
Abstract
The present invention relates to a method for quantifying one or more analytes in a sample by an analysis system comprising a separation unit (LC column), a means of adding a solution post-column (Connector), and a detection unit comprising a mass spectrometer coupled through an ionization source, the method comprising: ⋅ (i) inducing matrix effect on the analytes in the sample and on the post-column infused internal standards (PCI-ISs); ⋅ (ii) matching one or more post-column infused internal standard (PCI-IS) to each analyte that best matches the analyte's response to the matrix effect, and ⋅ (iii) storing the analyte-matched PCI-IS identification and, optionally, associated response data in a library; and ⋅ (iv) applying the analyte-matched PCI-IS to the analyte in other samples to correct the analyte peak responses for the matrix effect during ionization and to obtain (absolute) quantitation of the analyte using the response data.