The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2024
Filed:
Oct. 31, 2022
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Bunta Matsuhana, Kyoto, JP;
Yuto Maeda, Kyoto, JP;
Jiro Masuda, Kyoto, JP;
Kana Kojima, Kyoto, JP;
Takahiro Doki, Kyoto, JP;
Assignee:
Shimadzu Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/041 (2018.01); A61B 6/00 (2024.01); A61B 6/10 (2006.01); A61B 6/42 (2024.01);
U.S. Cl.
CPC ...
G01N 23/041 (2018.02); A61B 6/102 (2013.01); A61B 6/484 (2013.01); A61B 6/4291 (2013.01);
Abstract
This X-ray phase imaging system includes a plurality of gratings including a first grating that is irradiated with X-rays from an X-ray source and a second grating that is irradiated with X-rays from the first grating. The X-ray phase imaging system includes an imaging unit that optically images a subject and one or both of the first grating and the second grating.