The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2024

Filed:

Feb. 15, 2021
Applicant:

Signify Holding B.v., Eindhoven, NL;

Inventors:

Marc Andre De Samber, Lommel, BE;

Philip Steven Newton, Waalre, NL;

Assignee:

SIGNIFY HOLDING B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/956 (2006.01);
U.S. Cl.
CPC ...
G01N 21/956 (2013.01);
Abstract

An inspection system () for inspecting a lighting device () during an assembly process of the lighting device; wherein the lighting device comprises a base plate () and a plurality of components () mounted on the base plate; wherein the inspection system comprises: a light source () arranged for illuminating the lighting device according to a first light output spectrum for providing a luminance contrast between the base plate and the plurality of components; an imaging unit/camera () arranged for capturing a first image of the illuminated lighting device; a controller () comprising a processing unit for determining a luminance contrast measure of the captured first image; wherein the processing unit is further arranged for, when the luminance contrast measure of the captured first image exceeds a threshold value, adapting the first light output spectrum, and wherein the imaging unit is further arranged for capturing a second image of the lighting device illuminated according to the adapted first light output spectrum; and wherein the controller further comprises: a comparing unit arranged for comparing the second image with a reference image; a determination unit arranged for determining a defect in the base plate and/or in the plurality of components based on the comparison.


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