The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2024
Filed:
May. 13, 2022
Canon Kabushiki Kaisha, Tokyo, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An information processing apparatus selects, as a reference defect, at least one defect from among first defects associated with a first image and selects, as a correction target defect, at least one defect from among second defects associated with a second image captured at a time different from an image capturing time of the first image. Additionally, the information processing apparatus generates a correction candidate by modifying the correction target defect, acquires a matching level representing a matching relationship between the reference defect and the correction candidate, and generates a corrected defect by correcting the correction target defect based on the matching level. Then, the information processing apparatus acquires a progress level representing a change in defect from the reference defect based on a comparison between the reference defect and the corrected defect.