The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2024

Filed:

Apr. 24, 2023
Applicant:

Maxell, Ltd., Kyoto, JP;

Inventors:

Osamu Kawamae, Kyoto, JP;

Yukinobu Tanaka, Tokyo, JP;

Misako Kono, Tokyo, JP;

Nobuhiro Shiramizu, Tokyo, JP;

Masuo Oku, Kyoto, JP;

Manabu Katsuki, Kyoto, JP;

Megumi Kurachi, Kyoto, JP;

Assignee:

MAXELL, LTD., Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/3581 (2014.01); G01N 21/3504 (2014.01);
U.S. Cl.
CPC ...
G01N 21/3581 (2013.01); G01N 21/3504 (2013.01); G01N 2201/0221 (2013.01); G01N 2201/0222 (2013.01);
Abstract

Terahertz wave detection equipment comprises: a terahertz wave transceiver including a transmitter for transmitting a terahertz wave and a receiver for receiving a reflected terahertz wave reflected by a background reflected object which exists behind an object to be analyzed; a display; and an information processing apparatus, wherein the transmitter irradiates a terahertz wave based on a transmission signal including a specific frequency toward a two-dimensional area including the object to be analyzed, and the information processing apparatus is configured to analyze concentration of the object to be analyzed based on the reflected terahertz wave and generate a composite image in which a concentration image of the object to be analyzed is combined with an image of the background reflected object.


Find Patent Forward Citations

Loading…