The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2024
Filed:
Jun. 04, 2020
Centre National DE LA Recherche Scientifique, Paris, FR;
Cpe Lyon Formation Continue ET Recherche, Villeurbanne, FR;
Ecole Centrale DE Lyon, Ecully, FR;
Institut National Des Sciences Appliquees DE Lyon, Villeurbanne, FR;
Universite Claude Bernard Lyon 1, Villeurbanne, FR;
Avalun, Grenoble, FR;
Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;
Mathieu Dupoy, Grenoble, FR;
Taha Benyattou, Vourles, FR;
Lotfi Berguiga, Lyons, FR;
Jean-Marc Fedeli, Grenoble, FR;
Maryse Fournier, Grenoble, FR;
Nicolas Gaignebet, La Tour d'Aigues, FR;
Cecile Jamois, Caluire, FR;
Patrick Pouteau, Meylan, FR;
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, Paris, FR;
CPE LYON FORMATION CONTINUE ET RECHERCHE, Villeurbanne, FR;
ECOLE CENTRALE DE LYON, Ecully, FR;
INSTITUT NATIONAL DES SCIENCES APPLIQUEES DE LYON, Villeurbanne, FR;
UNIVESITE CLAUDE BERNARD LYON 1, Villeurbanne, FR;
AVALUN, Grenoble, FR;
COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES, Paris, FR;
Abstract
A method for analysing a sample uses a resonant support having a surface on which a plurality of separated photonic crystals extends. At least two crystals are configured to capture the same analyte. A resonance wavelength associated with each crystal varies with an amount of analyte in contact with the crystal. The wavelengths define a resonance spectral band between 200-1500 nm. The transmission/reflection of the light is maximum at an associated resonance wavelength. The method includes: illuminating the support in the resonance spectral band, the intensity of the lamination being variable in band; acquiring a measurement image using an image sensor, the image having different regions-of-interest each optically coupled to a photonic crystal; using a reference image representative of an image acquired by the image sensor, when the support is illuminated in the resonance spectral band in a reference configuration; and comparing the measurement image with the reference image.