The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2024
Filed:
Apr. 16, 2020
Pantech Corporation, Seoul, KR;
Xin Yuan, New Providence, NJ (US);
Paul Wilford, Bernardsville, NJ (US);
Mu Qiao, Summit, NJ (US);
Xuan Liu, Berkeley Heights, NJ (US);
PANTECH CORPORATION, Seoul, KR;
Abstract
An apparatus comprising: a double path interferometer comprising a sample path for an object and a reference path; a source of linearly polarized light for the double path interferometer, a phase plate positioned in the sample path; means for superposing the sample path and reference path to create a beam of light for detection; means for spatially modulating the beam of light to produce a modulated beam of light; means for dispersing the modulated beam of light to produce a spatially modulated and dispersed beam of light; a first detector; a second detector, and means for splitting the spatially modulated and dispersed beam of light, wherein light of a first linear polarization is directed to the first detector and light of a second linear polarization, orthogonal to the first linear polarization, is directed to the second detector.