The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2024
Filed:
Mar. 25, 2022
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventors:
Makoto Oigawa, Kanagawa, JP;
Shin Tanaka, Kanagawa, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/55 (2017.01); G01S 7/481 (2006.01); G01S 7/4865 (2020.01); G01S 17/10 (2020.01); G01S 17/86 (2020.01); G06T 7/246 (2017.01); H04N 17/00 (2006.01); B60Q 9/00 (2006.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); G01S 7/4814 (2013.01); G01S 7/4865 (2013.01); G01S 17/10 (2013.01); G01S 17/86 (2020.01); G06T 7/246 (2017.01); G06T 7/55 (2017.01); B60Q 9/00 (2013.01); G06T 2207/30252 (2013.01);
Abstract
In order to realize a device that can reduce the influence of errors, the device includes a first acquisition unit configured to acquire first information including an error via an image formation optical system, a second acquisition unit configured to acquire second information of which the error is less than that of the first information, a correction information generation unit configured to calculate a correction value for correcting the error of the first information on the basis of the second information, and a correction unit configured to correct the first information by using the correction value.