The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2024
Filed:
Sep. 23, 2022
Visa International Service Association, San Francisco, CA (US);
Yuhang Wu, Foster City, CA (US);
Sunpreet Singh Arora, San Mateo, CA (US);
Hao Yang, San Jose, CA (US);
VISA INTERNATIONAL SERVICE ASSOCIATION, San Francisco, CA (US);
Abstract
Training an adversarial perturbation detector comprises accessing a training set comprising an enrolled biometric sample xand a public biometric sample x of an enrolled user, and submitted biometric samples x' of a second user, the submitted biometric samples x′ comprising perturbed adversarial samples x′+Δx′. A transformation function k(⋅) is provided having learnable a parameter θ and a classifier having a learnable parameter σ. The training set is used to learn the parameters θ and σ by inputting the training set to the transformation function k(⋅). The transformation function k(⋅) generates transformed enrolled samples k(x), a transformed public biometric sample k(x), and a transformed adversarial sample k(x′+Δx′). The classifier classifies the transformed adversarial sample k(x′+Δx′) as a success or as a fail based on the transformed enrolled samples k(x). Based on a result of the classification, the learnable parameters θ and σ are updated.