The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2024

Filed:

Apr. 27, 2020
Applicant:

Semiconductor Energy Laboratory Co., Ltd., Atsugi, JP;

Inventors:

Shunpei Yamazaki, Tokyo, JP;

Tsutomu Murakawa, Kanagawa, JP;

Shinya Sasagawa, Kanagawa, JP;

Naoto Yamade, Kanagawa, JP;

Takashi Hamada, Kanagawa, JP;

Hiroki Komagata, Kanagawa, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/8234 (2006.01); H01L 21/225 (2006.01); H01L 21/28 (2006.01); H01L 29/66 (2006.01); H01L 27/088 (2006.01); H01L 29/786 (2006.01);
U.S. Cl.
CPC ...
H01L 21/823412 (2013.01); H01L 21/2253 (2013.01); H01L 21/28185 (2013.01); H01L 29/6675 (2013.01); H01L 27/088 (2013.01); H01L 29/7869 (2013.01); H01L 29/78696 (2013.01);
Abstract

To provide a semiconductor device with less variations, a first insulator is deposited; a stack of first and a second oxides and a first conductor is formed over the first insulator; a second insulator is formed over the first insulator and the stack; an opening is formed in the second insulator; a top surface of the second oxide is exposed by removing a region of the first conductor, second and third conductors are formed over the second oxide, and then cleaning treatment is performed; a first oxide film is deposited in contact with a side surface of the first oxide and top and side surfaces of the second oxide; heat treatment is performed on an interface between the second oxide and the first oxide film through the first oxide film; and the second insulator is exposed and a fourth conductor, a third insulator, and a third oxide are formed in the opening.


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