The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2024

Filed:

Mar. 20, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Gaku Nakano, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 3/40 (2006.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 3/40 (2013.01); G06T 2207/20076 (2013.01);
Abstract

In a camera calibration apparatus (), an external parameter calculation unit () calculates a rotation vector and a rotation matrix using the normalized start point coordinates, the normalized end point coordinates, and an 'evaluation function' obtained by the normalized coordinate transformation unit () for each normal vector in the image plane and then outputs the calculated translation vector and rotation matrix. The normal vectors in the image plane respectively correspond to a plurality of normal vectors in a world coordinate space with respect to a reference plane in the world coordinate space. The evaluation function is for overdetermining a rotation parameter around a normal line with respect to the above reference plane in the world coordinate space.


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